SN74BCT8373ADWR

The Texas Instruments SN74BCT8373ADWR is a scan test device belonging to the SCOPE family, designed with octal D-type latches. This integrated circuit supports the IEEE Standard 1149.1-1990 boundary scan architecture, facilitating the testing of complex circuit board assemblies. In its normal mode of operation, it is functionally equivalent to the 'F373 and 'BCT373 octal D-type latches.

The device operates within a supply voltage range of 4.5V to 5.5V and has an operating temperature range of 0°C to 70°C. It is packaged in a 24-SOIC (0.295", 7.50mm Width) surface-mount package. The SN74BCT8373ADWR is compatible with the IEEE 1149.1-1990 Test Access Port (TAP) and boundary-scan architecture, allowing test circuitry to be activated via the 4-wire TAP interface. This enables snapshot sampling of device terminal data or self-testing of boundary test cells without affecting functional operation.

When activated in test mode, the normal operation of the latches is inhibited, and the test circuitry is enabled to observe and control the device's I/O boundary. This capability is crucial for performing boundary scan tests as described in IEEE Standard 1149.1-1990. The device offers 8 bits of functionality and is suitable for applications requiring integrated testability features.