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SN74BCT8373ADWR IC SCAN TEST DEVICE LATCH 24SOIC
Mfr Part #:

SN74BCT8373ADWR

Available from 1 distributors
Mfr Name: Texas Instruments
Texas Instruments
Description:
IC SCAN TEST DEVICE LATCH 24SOIC
Total Stock: 3,305 pcs

SN74BCT8373ADWR Available from 1 distributors

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Non-Authorised
Distributor Stock Pricing MOQ PKG Lead Time Date Code On Order Quantity On Order Delivery
Non-Authorised Inventory information
3,305 pcs
3305 pcs On Request 1 On Request On Request On Request On Request On Request

SN74BCT8373ADWR Specifications Quick View

Most important parameters for selection – full specs in datasheet.
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Manufacturer Name
Logic Type
Mounting Type
Number of Bits
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Supply Voltage

SN74BCT8373ADWR Description

Short technical summary and product information.
IC SCAN TEST DEVICE LATCH 24SOIC

SN74BCT8373ADWR Quick Information

Mfr Standard Lead Time: 12 weeks (varies by distributor)
RoHS Status: RoHS Compliant
Moisture Sensitivity Level (MSL): 1 Unlimited
REACH Status: REACH Unaffected

SN74BCT8373ADWR Alternate Parts

Same form/fit/function or matching attribute configuration across different manufacturers.
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SN74BCT8373ADWRG4
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IC SCAN TEST DEVICE 24SOIC
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