Mfr Part #:

SN74BCT8373ADW

Name: SN74BCT8373ADW
SKU: SN74BCT8373ADW

Mfr Name: Texas Instruments

IC SCAN TEST DEVICE LATCH 24SOIC

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SN74BCT8373ADW Specifications Quick View

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Category	Specialty Logic
Manufacturer Name	Texas Instruments
Logic Type	Scan Test Device with D-Type Latches
Mounting Type	Surface Mount
Number of Bits	8
Operating Temperature	0°C ~ 70°C
Supplier Device Package	24-SOIC
Supply Voltage	4.5V ~ 5.5V

Short technical summary and product information.

IC SCAN TEST DEVICE LATCH 24SOIC

RoHS Status: RoHS Compliant

Moisture Sensitivity Level (MSL): 1 Unlimited

REACH Status: REACH Unaffected

Same form/fit/function or matching attribute configuration across different manufacturers.

SN74BCT8373ADWR

Texas Instruments

The SN74BCT8373ADWR is a scan test device from Texas Instruments featuring octal D-type latches. It operates with a supply voltage of 4.5V to 5.5V.

Texas Instruments

IC SCAN TEST DEVICE LATCH 24SOIC

Texas Instruments

IC SCAN TEST DEVICE 24SOIC