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SN74ABT8245DWR IC SCAN TEST DEV W/OBT 24-SOIC
Mfr Part #:

SN74ABT8245DWR

Available from 2 distributors
Mfr Name: Texas Instruments
Texas Instruments
Description:
IC SCAN TEST DEV W/OBT 24-SOIC
Total Stock: 701 pcs

SN74ABT8245DWR Available from 2 distributors

Authorised
Non-Authorised
Distributor Stock Pricing MOQ PKG Lead Time Date Code On Order Quantity On Order Delivery
Non-Authorised Inventory information
70 pcs
70 pcs On Request 1 On Request On Request On Request On Request On Request
Non-Authorised Inventory information
631 pcs
631 pcs On Request 1 On Request On Request On Request On Request On Request

SN74ABT8245DWR Specifications Quick View

Most important parameters for selection – full specs in datasheet.
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SN74ABT8245DWR Description

Short technical summary and product information.
IC SCAN TEST DEV W/OBT 24-SOIC

SN74ABT8245DWR Quick Information

Mfr Standard Lead Time: 12 weeks (varies by distributor)
RoHS Status: RoHS Compliant
Moisture Sensitivity Level (MSL): 1 Unlimited
REACH Status: REACH Unaffected

SN74ABT8245DWR Alternate Parts

Same form/fit/function or matching attribute configuration across different manufacturers.
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SN74ABT8245DW
SN74ABT8245DW
Texas Instruments
IC SCAN TEST DEV/TXRX 24-SOIC
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SN74ABT8245DWG4
SN74ABT8245DWG4
Texas Instruments
IC SCAN TEST DEVICE 24SOIC
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