| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
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750 pcs
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750 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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The SN74ABT8245DW is an octal bus transceiver designed as a scan test device, part of Texas Instruments' SCOPE family. This integrated circuit supports IEEE Standard 1149.1-1990 boundary scan architecture, facilitating the testing of complex circuitry.
Key electrical characteristics include an operating supply voltage range of 4.5V to 5.5V. The device is specified for operation across a temperature range of -40°C to 85°C. It features 8 bits of data transfer capability.
Packaged in a 24-SOIC (0.295", 7.50mm Width) surface mount configuration, the SN74ABT8245DW is suitable for various electronic designs requiring robust testability features. Its design is based on State-of-the-Art EPIC-IIB BiCMOS technology, which significantly reduces power dissipation.
| Qty | Low | High |
|---|---|---|
| 1+ | $4.31 | $4.31 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The supply voltage range is 4.5V to 5.5V.
The operating temperature range is -40°C to 85°C.
The SN74ABT8245DW is available in a 24-SOIC surface-mount package with a 7.50mm body width.
The logic type is Scan Test Device with Bus Transceivers.
The device supports 8 bits.