| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
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6 pcs
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6 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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The SNJ54BCT8374AFK from Texas Instruments is an octal D-type edge-triggered flip-flop designed for testability. It is part of the Texas Instruments SCOPE family of test-integrated circuits.
This device is functionally equivalent to the 'F374 and 'BCT374 in normal-function mode and is compatible with the IEEE Standard 1149.1-1990 (JTAG) test access port and boundary-scan architecture. Test operations are synchronous to the Test Access Port (TAP).
The SNJ54BCT8374AFK features a LCCC (FK) package with 28 pins. It has an operating temperature range of -55 to 125°C. The standard package quantity is 42 units in a TUBE carrier.
Key features include parallel-signature analysis at inputs and pseudo-random pattern generation from outputs, making it suitable for various testing applications.
| Qty | Low | High |
|---|---|---|
| 1+ | $73.98 | $73.98 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The operating temperature range is -55 to 125°C.
The package type is LCCC (FK).
The device has 28 pins.
It is a member of the Texas Instruments SCOPE TM Family of Testability Products, is functionally equivalent to 'F374 and 'BCT374 in normal-function mode, and is compatible with the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture.
The standard package quantity is 42 units.
The carrier type is TUBE.