| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
|---|---|---|---|---|---|---|---|---|---|
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132 pcs
|
132 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request | |
|
4 pcs
|
4 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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| Manufacturer Name | |
| Logic Type | |
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| Number of Bits | |
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| Supplier Device Package | |
| Supply Voltage |
The SN74LVTH18646APM from Texas Instruments is an 18-bit scan test device featuring transceivers and registers. This specialty logic IC is part of the Texas Instruments SCOPE and Widebus families, designed for testability and mixed-signal operation.
Key electrical characteristics include a supply voltage range of 2.7V to 3.6V, supporting unregulated battery operation down to 2.7V. The device operates across a temperature range of -40°C to 85°C, making it suitable for various environmental conditions.
This device supports IEEE Std 1149.1-1990 (JTAG) boundary scan architecture. It includes D-type flip-flops and control circuitry for multiplexed transmission of stored and real-time data. Bus hold on data inputs eliminates the need for external pullup/pulldown resistors. The B-port outputs have equivalent 25-series resistors, negating the need for external resistors.
The SN74LVTH18646APM is packaged in a 64-pin LQFP (10x10 mm) and is designed for surface mount applications. The standard package quantity is 160 units, supplied in a JEDEC TRAY.
| Qty | Low | High |
|---|---|---|
| 1+ | $10.74 | $10.74 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
2.7 V to 3.6 V
-40°C to 85°C
64-LQFP (10x10)
ABT Scan Test Device With Transceivers and Registers
18 bits
Surface Mount
JEDEC TRAY (10+1)