SN74LVTH18646APM The Texas Instruments SN74LVTH18646APM is an 18-bit ABT scan test device with transceivers and registers. It operates within a supply voltage range of 2.7V to 3.6V and an ambient temperature range of -40°C to 85°C.
Mfr Part #:

SN74LVTH18646APM

Available from 2 distributors
Mfr Name: Texas Instruments
Texas Instruments
The Texas Instruments SN74LVTH18646APM is an 18-bit ABT scan test device with transceivers and registers. It operates within a supply voltage range of 2.7V to 3.6V and an ambient temperature range of -40°C to 85°C.
✓ Total Stock: 136 pcs
$ Price Range: $10.74

SN74LVTH18646APM Available from 2 distributors

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132 pcs
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SN74LVTH18646APM Specifications Quick View

Most important parameters for selection – full specs in datasheet.
Category
Manufacturer Name
Logic Type
Mounting Type
Number of Bits
Operating Temperature
Supplier Device Package
Supply Voltage

SN74LVTH18646APM Description

Short technical summary and product information.

The SN74LVTH18646APM from Texas Instruments is an 18-bit scan test device featuring transceivers and registers. This specialty logic IC is part of the Texas Instruments SCOPE and Widebus families, designed for testability and mixed-signal operation.

 

Key electrical characteristics include a supply voltage range of 2.7V to 3.6V, supporting unregulated battery operation down to 2.7V. The device operates across a temperature range of -40°C to 85°C, making it suitable for various environmental conditions.

 

This device supports IEEE Std 1149.1-1990 (JTAG) boundary scan architecture. It includes D-type flip-flops and control circuitry for multiplexed transmission of stored and real-time data. Bus hold on data inputs eliminates the need for external pullup/pulldown resistors. The B-port outputs have equivalent 25-series resistors, negating the need for external resistors.

 

The SN74LVTH18646APM is packaged in a 64-pin LQFP (10x10 mm) and is designed for surface mount applications. The standard package quantity is 160 units, supplied in a JEDEC TRAY.

SN74LVTH18646APM Quick Information

Product Type: Specialty Logic IC
Series: Widebus
Canonical Name: SN74LVTH18646A 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers
Subcategory: Transceiver

SN74LVTH18646APM Compliance

RoHS Status: RoHS Compliant
Moisture Sensitivity Level (MSL): 1 Unlimited
REACH Status: REACH Unaffected

SN74LVTH18646APM Estimated Pricing

Qty Low High
1+ $10.74 $10.74

Estimated market price range - modelled values for guidance only, not live distributor offers.

SN74LVTH18646APM Features

  • 18-bit ABT scan test device with transceivers.
  • Supports 3.3V operation with 2.7V to 3.6V range.
  • Operates from -40°C to 85°C ambient temperature.
  • 64-pin LQFP package for surface mounting.
  • IEEE 1149.1-1990 JTAG boundary scan compatible.

SN74LVTH18646APM Applications

  • Facilitates testing of complex circuit board assemblies.
  • Supports mixed-signal operation with 5V tolerance.
  • Ideal for testability in embedded systems.
  • Used in systems requiring boundary scan architecture.

SN74LVTH18646APM FAQs

7 frequently asked questions generated from this part’s specifications.
What is the supply voltage range?

2.7 V to 3.6 V

What is the operating temperature range?

-40°C to 85°C

What is the package type?

64-LQFP (10x10)

What is the logic type?

ABT Scan Test Device With Transceivers and Registers

How many bits does the device have?

18 bits

What is the mounting type?

Surface Mount

What is the carrier packaging?

JEDEC TRAY (10+1)

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