SN74LVT8980ADWRG4

The Texas Instruments SN74LVT8980ADWRG4 is an embedded test-bus controller designed for board and system-level test and maintenance facilities. It supports IEEE Std 1149.1 (JTAG) TAP Masters with an 8-bit generic host interface.

This device features 8 channels, TTL-Compatible CMOS input, and 3-State output. It operates with a supply voltage ranging from 2.7V to 3.6V and has an operating temperature range of -40°C to 85°C. Key features include balanced outputs, partial power down (Ioff), positive input clamp diode, power-up 3-state, and very high speed with a typical propagation delay (tpd) between 5-10ns.

The SN74LVT8980ADWRG4 is housed in a 24-SOIC package, suitable for surface mount applications. The TAP interface is 5-V tolerant, allowing it to master both 5-V and 3.3-V IEEE Std 1149.1 targets. It offers high-drive outputs (-32mA IOH, 64mA IOL) supporting backplane interfaces and high fanout.

Designed for easy programming via a scan-level command set and smart TAP control, it transparently generates protocols for multidrop TAP configurations. The flexible TCK generator provides programmable division, gated-TCK, and free-running-TCK modes. A programmable 32-bit test cycle counter allows for virtually unlimited scan/test length, accommodating target retiming delays of up to 15 TCK cycles.