SN74LVT8980ADW

The SN74LVT8980ADW from Texas Instruments is an 8-channel Embedded Test-Bus Controller, part of their LVT technology family. This device is designed for surface mount applications and comes in a 24-SOIC package.

Key electrical characteristics include TTL-Compatible CMOS input types and 3-State output types. It supports a supply voltage range of 2.7V to 3.6V and operates within an ambient temperature range of -40°C to 85°C. The device features balanced outputs, partial power down (Ioff), a positive input clamp diode, and power-up 3-state capabilities, offering very high speed performance with propagation delays typically between 5-10ns.

This controller is a member of Texas Instruments' Broad Family of Testability Products, supporting the IEEE Std 1149.1 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture. It provides built-in access to scan-accessible test/maintenance facilities at board and system levels. The TAP interface is fully 5-V tolerant, allowing it to master both 5-V and 3.3-V IEEE Std 1149.1 targets while powered at 3.3 V. It offers a simple interface to low-cost 3.3-V microprocessors/microcontrollers via an 8-bit asynchronous read/write data bus.

Additional features include easy programming via a scan-level command set and Smart TAP control, transparent protocol generation for multidrop TAP configurations using TI's Addressable Scan Port, and a flexible TCK generator with programmable division, gated-TCK, and free-running-TCK modes. A discrete TAP control mode supports arbitrary TMS/TDI sequences for noncompliant targets, and a programmable 32-bit test cycle counter allows for virtually unlimited scan/test length. It can accommodate target retiming delays of up to 15 TCK cycles, and the Test Output Enable (TOE) allows for external control of TAP signals. High-drive outputs (-32-mA I OH , 64-mA I OL ) at TAP support backplane interface and/or high fanout.