Mfr Part #:

SN74BCT8374ANT

Name: SN74BCT8374ANT
Brand: Texas Instruments
SKU: SN74BCT8374ANT

Mfr Name: Texas Instruments

Description:

IC SCAN TEST DEVICE W/FF 24-DIP

Stock on Request

SN74BCT8374ANT Specifications Quick View

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Category	Specialty Logic
Manufacturer Name	Texas Instruments
Logic Type	Scan Test Device with D-Type Edge-Triggered Flip-Flops
Mounting Type	Through Hole
Number of Bits	8
Operating Temperature	0°C ~ 70°C
Supplier Device Package	24-PDIP
Supply Voltage	4.5V ~ 5.5V

Short technical summary and product information.

IC SCAN TEST DEVICE W/FF 24-DIP

Mfr Standard Lead Time: 12 weeks (varies by distributor)

RoHS Status: RoHS Compliant

Moisture Sensitivity Level (MSL): 1 Unlimited

REACH Status: REACH Unaffected

Same form/fit/function or matching attribute configuration across different manufacturers.

Texas Instruments

IC SCAN TEST DEVICE W/FF 24-DIP