Mfr Part #:

SN74BCT8373ANT

Name: SN74BCT8373ANT
Brand: Texas Instruments
SKU: SN74BCT8373ANT

Mfr Name: Texas Instruments

Description:

IC SCAN TEST DEVICE LATCH 24-DIP

Stock on Request

SN74BCT8373ANT Specifications Quick View

Most important parameters for selection – full specs in datasheet.

SELECT ALL

Category	Specialty Logic
Manufacturer Name	Texas Instruments
Logic Type	Scan Test Device with D-Type Latches
Mounting Type	Through Hole
Number of Bits	8
Operating Temperature	0°C ~ 70°C
Supplier Device Package	24-PDIP
Supply Voltage	4.5V ~ 5.5V

Short technical summary and product information.

IC SCAN TEST DEVICE LATCH 24-DIP

Mfr Standard Lead Time: 12 weeks (varies by distributor)

RoHS Status: RoHS Compliant

Moisture Sensitivity Level (MSL): 1 Unlimited

REACH Status: REACH Unaffected