| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
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996 pcs
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996 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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The SN74BCT8240ADWR from Texas Instruments is an octal scan test device featuring inverting buffers. This component is part of the SCOPE family and supports IEEE Standard 1149.1-1990 boundary scan architecture.
Designed for testability, this device functions equivalently to the 'F240 and 'BCT240 octal buffers in normal mode. In test mode, it enables boundary-scan test operations to facilitate testing of complex circuit-board assemblies. The device operates with a supply voltage range of 4.5V to 5.5V and has an operating temperature range of 0°C to 70°C.
It is packaged in a 24-SOIC (0.295", 7.50mm Width) format and is designed for surface mounting. The SN74BCT8240ADWR is compatible with the JTAG test access port and boundary-scan architecture, offering features like parallel-signature analysis at inputs and pseudo-random pattern generation from outputs.
| Qty | Low | High |
|---|---|---|
| 1+ | $0.50 | $0.50 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The SN74BCT8240ADWR operates from a supply voltage of 4.5V to 5.5V.
The operating temperature range for the SN74BCT8240ADWR is 0°C to 70°C.
The SN74BCT8240ADWR is supplied in a 24-SOIC package.
The SN74BCT8240ADWR is RoHS3 Compliant.
The Moisture Sensitivity Level (MSL) for the SN74BCT8240ADWR is 1 Unlimited.
The SN74BCT8240ADWR is REACH Unaffected.