Mfr Part #:

SN74ABTH18646APM

The Texas Instruments SN74ABTH18646APM is an 18-bit scan test device featuring transceivers and registers. It operates within a temperature range of -40°C to 85°C and has TTL-Compatible CMOS input with 3-State outputs.

✓ Total Stock: 7 pcs

$ Price Range: $13.31

SN74ABTH18646APM Available from 1 distributor

✓ Authorised

✓ Non-Authorised

Distributor		Stock	Pricing	MOQ	PKG	Lead Time	Date Code	On Order Quantity	On Order Delivery
Speed Components Ltd ✓ Non-Authorised Inventory information	7 pcs On Request	7 pcs	On Request	1	On Request	On Request	On Request	On Request	On Request

SN74ABTH18646APM Description

Short technical summary and product information.

The SN74ABTH18646APM from Texas Instruments is an 18-bit scan test device that integrates transceivers and registers. This component is part of the SCOPE family of testability products and is compatible with the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture.

Key electrical characteristics include a supply voltage range of 4.5V to 5.5V, TTL-Compatible CMOS input, and 3-State outputs. It offers a maximum IOL of 64mA and a maximum IOH of -15mA. The device features bus hold on data inputs, eliminating the need for external pullup resistors, and its B-port outputs have equivalent 25-Ohm series resistors.

Designed with state-of-the-art EPIC-IIB BiCMOS technology, the SN74ABTH18646APM provides one boundary-scan cell per I/O for improved scan efficiency. It supports various SCOPE instruction set functions, including parallel-signature analysis at inputs and pseudo-random pattern generation from outputs.

This device is available in a 64-pin LQFP package, suitable for surface mount applications. The operating temperature range is specified from -40°C to 85°C, making it suitable for a variety of industrial environments.

SN74ABTH18646APM Quick Information

Product Type: Scan Test Device

Series: ABTH

Canonical Name: Texas Instruments SN74ABTH18646APM Scan Test Device With 18-Bit Transceivers and Registers

Subcategory: Specialty Logic

SN74ABTH18646APM Compliance

RoHS Status: RoHS Compliant

Moisture Sensitivity Level (MSL): 1 Unlimited

REACH Status: REACH Unaffected

SN74ABTH18646APM Estimated Pricing

Qty	Low	High
1+	$13.31	$13.31

Estimated market price range - modelled values for guidance only, not live distributor offers.

SN74ABTH18646APM Features

18-bit scan test device with transceivers.
Compatible with IEEE 1149.1 (JTAG) boundary-scan.
TTL-Compatible CMOS input, 3-State outputs.
Bus hold on data inputs eliminates pullups.
Operates from -40°C to 85°C.

SN74ABTH18646APM Applications

Ideal for board-level testing.
Used in automated test equipment.
Supports in-system programming.
Facilitates device diagnostics.

SN74ABTH18646APM FAQs

6 frequently asked questions generated from this part’s specifications.

What is the operating voltage range of the SN74ABTH18646APM?

4.5V to 5.5V.

What package does the SN74ABTH18646APM come in?

64-LQFP (10x10) surface-mount package.

What is the operating temperature range?

-40°C to 85°C.

Does the SN74ABTH18646APM have bus-hold on inputs?

Yes, it has bus-hold on data inputs.

What is the maximum output low current (IOL)?

64 mA.

Is the device compatible with JTAG boundary scan?

Yes, it is compatible with IEEE Standard 1149.1-1990 (JTAG).

Category	Specialty Logic
Manufacturer Name	Texas Instruments
Features	Bus-hold, Partial power down (Ioff), Very high speed (tpd 5-10ns)
Input Type	TTL-Compatible CMOS
Logic Type	Scan Test Device With Transceivers And Registers
Mounting Type	Surface Mount
Number of Bits	18
Number of Channels	18
Operating Temperature	-40°C
Output Type	3-State
Supplier Device Package	64-LQFP (10x10)
Supplier Package	64-LQFP (10x10)
Supply Voltage	4.5V
Technology	EPIC-IIB BiCMOS