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80 pcs
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80 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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The SN74ABT8952DL from Texas Instruments is a scan test device featuring octal registered bus transceivers. This component is part of the SCOPE family and supports the IEEE Standard 1149.1-1990 boundary scan architecture, facilitating testing of complex circuit-board assemblies via a 4-wire test access port (TAP).
In its normal operating mode, the SN74ABT8952DL is functionally equivalent to the 'BCT2952 and 'ABT2952 octal registered bus transceivers. The device operates with a supply voltage range of 4.5V to 5.5V and has an operating temperature range of -40°C to 85°C. It is designed for surface mounting and comes in a 28-BSSOP package.
Key features include an 8-bit data path and compatibility with the JTAG test access port. The state-of-the-art EPIC-IIB BiCMOS design significantly reduces power dissipation. This device is suitable for applications requiring advanced testability features on complex digital systems.
| Qty | Low | High |
|---|---|---|
| 1+ | $0.50 | $0.50 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The SN74ABT8952DL is a Scan Test Device with Registered Bus Transceiver.
The SN74ABT8952DL supports 8 bits.
The supply voltage range for the SN74ABT8952DL is 4.5V to 5.5V.
The operating temperature range for the SN74ABT8952DL is -40°C to 85°C.
The SN74ABT8952DL is available in a 28-BSSOP package.
The SN74ABT8952DL uses surface mount technology.