| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
|---|---|---|---|---|---|---|---|---|---|
|
36 pcs
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36 pcs | On Request | 1 | On Request | On Request | 98 | On Request | On Request |
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The SN74ABT8646DL is an 8-bit scan test device that integrates a bus transceiver and registers. It is part of the ABT technology family from Texas Instruments, designed for high-speed logic applications.
The device features TTL-compatible CMOS inputs and 3-state outputs, with maximum IOL of 64 mA and IOH of -32 mA. The supply voltage range is 4.5V to 5.5V, and it operates over a temperature range of -40°C to 85°C. It includes partial power down (Ioff) and very high speed with propagation delay of 5-10 ns.
The SN74ABT8646DL is available in a 28-BSSOP package with a width of 7.50mm, suitable for surface mount applications.
| Qty | Low | High |
|---|---|---|
| 1+ | $0.50 | $0.50 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The supply voltage range is 4.5V to 5.5V.
The operating temperature range is -40°C to 85°C.
It uses a 28-BSSOP package (0.295", 7.50mm width).
It has 8 bits and 8 channels.
Maximum IOL is 64 mA and maximum IOH is -32 mA.
It belongs to the ABT technology family.
Input type is TTL-Compatible CMOS, output type is 3-State.