| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
|---|---|---|---|---|---|---|---|---|---|
|
35 pcs
|
35 pcs | On Request | 1 | On Request | On Request | 97 | On Request | On Request |
| Category | |
| Manufacturer Name | |
| Features | |
| Industrial Grade | |
| Input Type | |
| Logic Type | |
| Mounting Type | |
| Number of Bits | |
| Operating Temperature | |
| Output Type | |
| Supplier Device Package | |
| Supplier Package | |
| Supply Voltage |
The SN74ABT18640DL is a scan test device with inverting bus transceivers from Texas Instruments, part of the ABT technology family. It features 18 channels and is designed for high-speed operation with a typical propagation delay of 5-10ns. The device supports partial power down (Ioff) for power savings.
Electrical characteristics include a supply voltage range of 4.5V to 5.5V, TTL-compatible CMOS inputs, and 3-state outputs. The output sink current is 64mA maximum, and output source current is -32mA maximum. The operating temperature range is -40°C to 85°C.
The device is housed in a 56-SSOP (56-BSSOP) surface mount package with a 7.50mm width. It is suitable for applications requiring scan testing and bus transceiver functionality in digital systems.
| Qty | Low | High |
|---|---|---|
| 1+ | $7.99 | $7.99 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
4.5V to 5.5V.
56-SSOP (56-BSSOP, 0.295", 7.50mm Width) surface mount.
-40°C to 85°C.
18 channels.
Scan Test Device with Inverting Bus Transceivers.
3-State outputs.
Partial power down (Ioff) and very high speed (tpd 5-10ns).