| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
|---|---|---|---|---|---|---|---|---|---|
|
2,500 pcs
|
2500 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
| Category | |
| Manufacturer Name | |
| Interface | |
| Lead Spacing | |
| Lead Style | |
| Memory Type | |
| Mounting Type | |
| Package / Case | |
| Storage Temperature |
The Spansion S29GL512P11TFI010 is a high-performance Flash memory component fabricated using 90nm MirrorBit process technology. It provides a single 3V read, program, and erase capability with a voltage range of 2.7-3.6V. This device features a fast page access time of 25ns and a random access time as low as 90ns.
Key features include a 32-word/64-byte write buffer that significantly reduces programming time for multiple-word updates, making it ideal for embedded systems. The memory is organized in a uniform 64 Kword/128 Kbyte sector architecture. It also offers enhanced VersatileI/O control, allowing input and output levels to be determined by the VIO input voltage.
This Flash memory is designed for applications requiring higher density, better performance, and lower power consumption. It is available in 56-pin TSOP and 64-ball Fortified BGA packages, supporting surface mount applications. The device typically offers 100,000 erase cycles per sector and 20-year data retention.
The device operates from 2.7V to 3.6V for read, program, and erase, with a VIO range of 1.65V to 3.6V.
It is available in TSOP and BGA packages, surface mount.
It is a Parallel NOR Flash memory using 90nm MirrorBit technology.
Page access time is 25 ns maximum; random access time is 90 ns maximum.
Each sector supports 100,000 erase cycles typical.
Typical data retention is 20 years.
The write buffer is 64 bytes.