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150 pcs
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150 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request | |
| On Request | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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The NE5537D is a monolithic sample-and-hold amplifier from NXP Semiconductors, designed to combine high accuracy with fast acquisition times and a low droop rate. It utilizes a combination of ion-implanted JFETs and bipolar devices for superior performance.
Key electrical specifications include operation from ±5V to ±18V supplies, a typical hold leakage current of 6pA at 25°C, and an acquisition time of less than 4μs. The device offers a typical hold step of 0.5mV with a 0.01μF hold capacitor and a low input offset voltage of 1mV. It can drive a 2kΩ load and features TTL, PMOS, and CMOS compatible logic input.
Available in 8-lead TO-5, 8-pin plastic DIP, and 14-pin SO packages, the NE5537D is suitable for various applications requiring precise sample-and-hold functionality. The operating temperature range for the NE5537 variant is 0°C to +70°C, while the SE5537 variant operates from -55°C to +125°C.
| Qty | Low | High |
|---|---|---|
| 1+ | $0.99 | $0.99 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The NE5537D operates from ±5V to ±18V supplies.
The acquisition time is less than 4μs.
The typical hold leakage current is 6pA at 25°C.
The logic input is compatible with TTL, PMOS, and CMOS logic.
The NE5537D operates from 0°C to +70°C.
The NE5537D is available in 8-lead TO-5, 8-pin plastic DIP, and 14-pin SO packages.