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35 pcs
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35 pcs | On Request | 1 | On Request | On Request | 04+ | On Request | On Request |
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The LTC2107CGN is a high-performance 16-bit Analog to Digital Converter (ADC) from Analog Devices, Inc., capable of sampling at up to 210MSPS. Its combination of high sample rate, low noise, and high linearity makes it suitable for a new generation of digital radio designs.
The direct sampling front-end is designed for demanding receiver applications such as software-defined radio and multi-channel GSM base stations. The AC performance includes an SNR of 80dBFS and an SFDR of 98dBFS. With an aperture jitter of 45fsRMS, it allows direct sampling of IF frequencies up to 500MHz with excellent performance.
Features like internal dither, a PGA front-end, and digital output randomization help maximize performance. Operation modes can be controlled via a 3-wire serial interface (SPI). The double data rate (DDR) low voltage differential (LVDS) digital outputs reduce digital line count and enable space-saving designs. The device is available in a 48-lead QFN package.
Applications include Software Defined Radios, Military Radio and RADAR, Cellular Base Stations, Spectral Analysis, Imaging Systems, and ATE and Instrumentation.
The LTC2107CGN has a resolution of 16-Bit.
The maximum sample rate for the LTC2107CGN is 210MSPS.
The typical SNR of the LTC2107CGN is 79.8dBFS.
The typical INL for the LTC2107CGN is 1.6LSBs.
The typical input voltage range for the LTC2107CGN is 2.5Vp-p.
The data output interface is Parallel DDR LVDS.
The typical power dissipation of the LTC2107CGN is 1.28W.
The SFDR of the LTC2107CGN is 98dBFS.
The SNR of the LTC2107CGN is 80dBFS.
The aperture jitter of the LTC2107CGN is 45fsRMS.
The LTC2107CGN is available in SOP and 48-Lead (7mm × 7mm) QFN packages.