| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
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125 pcs
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125 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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| Manufacturer Name |
The HPMX-5001 is an integrated circuit manufactured by N-A. This part has been subjected to rigorous reliability testing to ensure performance under various conditions.
Key tests include High Temperature Operating Life (O.L.) at 150°C and 130°C for 1000 hours, with zero failures reported in both conditions. Thermal Shock testing from -55°C to +125°C over 200 cycles also showed zero failures. Moisture Resistance and Autoclave tests were also performed with no failures.
Failure rate predictions are available based on junction temperature, with FIT rates decreasing significantly at lower temperatures. For example, at 60°C, the 90% confidence level FIT is 12, and the MTTF is 83,900,000 hours. The device meets flammability test standards and has an ESD susceptibility classification of Class 1.
This data is derived from cumulative test results obtained from product qualification, reliability monitoring, and engineering evaluation.
| Qty | Low | High |
|---|---|---|
| 1+ | $4.95 | $4.95 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The HPMX-5001 showed 0 failures in 129,000 hours at 150°C and 0 failures in 177,000 hours at 130°C during High Temperature Operating Life tests.
At 100°C, the 90% confidence level failure rate prediction for the HPMX-5001 is 163 FIT.
The Mean Time To Failure (MTTF) for the HPMX-5001 at 80°C with a 90% confidence level is 21,100,000 hours.
Yes, the HPMX-5001 meets the Needle Flame test per UL Category D under Material Classification 94VO.
The HPMX-5001 has an ESD susceptibility classification of Class 1 per EIA/JESD2-A114-A.