| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
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4,000 pcs
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4000 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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The DS2174Q by Analog Devices (Maxim Integrated) is a software-programmable test-pattern generator, receiver, and analyzer designed for digital transmission facilities. It meets stringent error-performance requirements and features bit-serial, nibble-parallel, and byte-parallel data interfaces.
Key specifications include a serial mode clock rate of 155MHz and a byte mode clock rate of 80MHz, providing a net data rate of 622Mbps. The device supports pseudorandom patterns of the form 2^n - 1 and user-defined repetitive patterns up to 512 octets. It can detect polynomial test patterns in the presence of bit error rates up to 10^-2.
This IC is available in a 44-PLCC package and is surface mountable. It operates within a temperature range of 0°C to 70°C with a supply voltage of 3V to 3.6V and a current consumption of 50mA.
Applications for the DS2174Q include routers, Channel Service Units (CSUs), Data Service Units (DSUs), multiplexers, switches, Digital-to-Analog Converters (DACs), CPE equipment, bridges, and Smart Jacks.
The operating temperature range for the DS2174Q is 0°C to 70°C.
The DS2174Q is available in a 44-PLCC (16.59x16.59) supplier device package and a 44-LCC (J-Lead) package.
The supply voltage for the DS2174Q is between 3V and 3.6V.
The current consumption for the DS2174Q is 50mA.
The DS2174Q is an Enhanced Bit Error Rate Tester (EBERT).
The DS2174Q supports E1, J1, and T1 interfaces.
The serial mode clock rate for the DS2174Q is 155MHz.