| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
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1,514 pcs
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1514 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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The BS170 is an N-Channel Enhancement Mode Field Effect Transistor manufactured by Osram, designed for high-speed switching applications. This component is housed in a standard TO-92 plastic package, making it suitable for through-hole mounting.
Key electrical characteristics include a drain-source breakdown voltage (VDSS) of 60V and a continuous drain current (ID) of up to 500mA at 25°C. The power dissipation (PD) is rated at 0.83W at 25°C. The drain-source on-resistance (RDS(on)) is a maximum of 5 Ohms when driven at VGS=10V and ID=200mA. The gate-source threshold voltage (VGS(th)) typically ranges from 0.8V to a maximum of 3.0V.
Capacitance values include input capacitance (Ciss) typically 24pF (max 40pF), output capacitance (Coss) typically 17pF (max 30pF), and reverse transfer capacitance (Crss) typically 7pF (max 10pF). Switching characteristics show a typical turn-on delay time (td(on)) and off delay time (td(off)) of 10nS under specified test conditions.
Thermal management is important, with a maximum junction temperature (Tj) and storage temperature (Tstg) of 150°C. The BS170 is a versatile MOSFET for various electronic designs requiring efficient switching.
| Qty | Low | High |
|---|---|---|
| 1+ | $0.99 | $0.99 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The maximum drain-source voltage (VDSS) is 60V.
The BS170 is offered in a TO-92 through-hole package.
The junction and storage temperature range is -55°C to 150°C.
The maximum continuous drain current (ID) is 500mA at Tc=25°C.
The maximum drain-source on-resistance (RDS(on)) is 5Ω at VGS=10V and ID=200mA.
The gate threshold voltage (VGS(th)) is typically 0.8V and maximum 3.0V at VDS=VGS and ID=1mA.
Typical turn-on delay time (td(on)) and turn-off delay time (td(off)) are both 10ns under specified test conditions.