BCT8244A

The Texas Instruments BCT8244A is a scan test device featuring octal buffers, designed as part of the SCOPE™ testability integrated-circuit family. This device supports the IEEE Standard 1149.1-1990 boundary scan architecture, facilitating the testing of complex circuit-board assemblies. Scan access is achieved via a 4-wire test access port (TAP) interface.

In its normal operating mode, the BCT8244A is functionally equivalent to the 'F244 and 'BCT244 octal buffers. The integrated test circuitry can be activated through the TAP to capture data snapshots at device terminals or to perform self-tests on boundary-test cells without affecting normal functional operation. When activated in test mode, the normal operation of the octal buffers is inhibited, enabling the test circuitry to observe and control the device's I/O boundary for boundary-scan test operations.

Key features include synchronous test operation to the TAP, support for an optional test reset signal triggered by a specific voltage on the TMS pin, and a SCOPE™ instruction set that includes IEEE Standard 1149.1-1990 required instructions along with optional INTEST, CLAMP, and HIGHZ instructions. It also supports parallel-signature analysis at inputs and pseudo-random pattern generation from outputs, along with the ability to sample inputs and toggle outputs.

The BCT8244A is available in a plastic small-outline (DW) package, commonly referred to as SOIC. It operates within a temperature range of 0 to 70°C and is supplied in standard package quantities of 25 units per tube.