| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
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6,216 pcs
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6216 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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The Texas Instruments AFE2256TDU is a high-performance 256-channel analog front-end (AFE) designed for digital X-ray flat-panel detectors. This integrated circuit offers a 16-bit Analog-to-Digital Converter (ADC) on-chip, providing precise data conversion for imaging applications.
Key electrical specifications include a selectable full-scale input range from 0.6 pC to 9.6 pC, with low correlated noise of 750 Electrons RMS. The integral nonlinearity is ±2 LSB, ensuring accuracy. The device supports scan times ranging from less than 20 µs to 204.8 µs, facilitating rapid data acquisition. Power is supplied via dual rails, AVDD1 at 1.85 V and AVDD2 at 3.3 V.
Designed for efficiency, the AFE2256TDU includes features like Nap Mode and Total Power-Down modes to reduce power consumption. It utilizes an SPI/LVDS interface for communication and operates within a temperature range of 0°C to 85°C. The component is supplied in a 320-COF (Chip-On-Film) package, with dimensions of 38 mm x 28 mm, suitable for compact detector designs.
| Qty | Low | High |
|---|---|---|
| 1+ | $146.36 | $146.36 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The AFE2256TDU has 256 input channels.
The AFE2256TDU features a 16-bit resolution.
The operating temperature range is 0°C to 85°C.
The AFE2256TDU supports SPI and LVDS interface types.
The AFE2256TDU requires power supplies of 1.85 V and 3.3 V.
The noise performance is 750 Electrons RMS.
The integral nonlinearity is ±2 LSB.