ADS5560IRGZT

The ADS5560IRGZT is a high-performance 16-bit analog-to-digital converter (ADC) from Texas Instruments with a maximum sampling rate of 40 MSPS. It employs a pipelined architecture and accepts a single differential input. The device provides a typical signal-to-noise ratio (SNR) of 84.3 dB, an effective number of bits (ENOB) of 13.5 bits, and a spurious-free dynamic range (SFDR) of 90 dB. The analog input bandwidth is 250 MHz, and the peak-to-peak input voltage range is 3.6 V.

Power consumption is typically 674 mW from a 3.0 V to 3.6 V supply. The ADC supports both double data rate (DDR) LVDS and parallel CMOS output interfaces, and includes an internal reference that requires no external decoupling capacitors. Additional features include programmable fine gain in 1-dB steps up to 6 dB, and a low-frequency noise suppression mode.

The ADS5560IRGZT is housed in a 48-VFQFN exposed pad package (48-VQFN, 7 mm x 7 mm) and is designed for surface mount assembly. It operates over a temperature range of -40°C to 85°C. This device is suitable for applications requiring high-speed data conversion with high dynamic performance.