ADS5517IRGZT

The ADS5517IRGZT is a high-performance 11-bit analog-to-digital converter (ADC) from Texas Instruments, designed for sampling rates up to 200 MSPS. It employs a pipelined architecture and supports a single differential input with a 2 Vpp range. The device offers a typical analog input bandwidth of 700 MHz, making it suitable for high-frequency signal processing. It provides both LVDS and parallel CMOS output options for flexible data interface.

Key electrical characteristics include a typical signal-to-noise ratio (SNR) of 67.1 dB at 70 MHz IF, spurious-free dynamic range (SFDR) of 86 dBc, and an effective number of bits (ENOB) of 10.8 bits. The ADC operates from a single 3.3V supply and consumes 1.23 W of power typically. It supports both internal and external reference options and includes a programmable output clock position to ease data capture.

The device is housed in a 48-VQFN (7x7 mm) package with an exposed pad for thermal management. It is specified for an operating temperature range of -40°C to 85°C. Typical applications include wireless communications infrastructure, software defined radio, power amplifier linearization, test and measurement instrumentation, and medical imaging systems.