| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
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2,238 pcs
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2238 pcs | On Request | 1 | On Request | On Request | 0923+ | On Request | On Request |
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The ADS5517IRGZR from Texas Instruments is a high-performance 11-bit Analog-to-Digital Converter (ADC) capable of sampling at rates up to 200 MSPS. It utilizes a pipelined architecture to achieve its high speed and resolution.
Key electrical specifications include an analog input bandwidth of 700 MHz, a signal-to-noise ratio (SNR) of 67.1 dB, and a spurious-free dynamic range (SFDR) of 86 dB. The device operates over a temperature range of -40°C to 85°C and supports a supply voltage range of 3V to 3.6V. Power consumption is typically 1230 mW.
This ADC is available in a 48-VQFN (7x7 mm) surface-mount package. The data interface supports both LVDS and Parallel CMOS outputs. It is suitable for applications requiring high-speed data conversion.
Applications include wireless communications infrastructure, software-defined radio, power amplifier linearization, test and measurement instrumentation, high definition video, medical imaging, and radar systems.
| Qty | Low | High |
|---|---|---|
| 1+ | $35.04 | $35.04 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The ADS5517IRGZR has an 11-bit resolution.
The maximum sample rate is 200 MSPS.
The analog input bandwidth is 700 MHz.
The operating temperature range is -40°C to 85°C.
It is supplied in a 48-VQFN (7x7) surface mount package.
The typical power consumption is 1230 mW.
It supports both LVDS and Parallel CMOS output options.