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75 pcs
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75 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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| ESD Protection | |
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| Input Logic Level | |
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| Max Propagation Delay @ V, Max CL | |
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The 74HCT03N,652 from NXP Semiconductors is a quad 2-input NAND gate integrated circuit featuring open-drain outputs. This device is designed for TTL level input compatibility and operates within a temperature range of -40°C to 125°C.
Key electrical characteristics include a supply voltage range of 4.5V to 5.5V and a maximum output current of 4mA. The maximum propagation delay is specified at 24ns at 4.5V with a 50pF load capacitance. Inputs include clamp diodes, allowing the use of current-limiting resistors for interfacing with voltages exceeding VCC.
This component complies with JEDEC standard no. 7A and offers ESD protection exceeding 2000V (HBM) and 200V (MM). It is available in a 14-DIP through-hole package, making it suitable for various electronic designs requiring reliable logic operations.
The 74HCT03N,652 is specified for applications requiring NAND logic functionality with open-drain outputs, providing flexibility in circuit design. Its robust operating temperature range and ESD protection make it suitable for demanding environments.
| Qty | Low | High |
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| 1+ | $0.22 | $0.22 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The operating voltage range is 4.5V to 5.5V.
14-DIP (0.300", 7.62mm) through-hole package.
-40°C to +125°C.
Yes, the input levels are TTL level and the device complies with JEDEC standard no. 7A.
Yes, it features open-drain outputs.
Typical propagation delay is 24ns at 4.5V with a 50pF load.
Exceeds 2000V HBM (JESD22-A114F) and 200V MM (JESD22-A115-A).