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5 pcs
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5 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
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The HP 5082-3077 is a PIN Diode from Hewlett-Packard, suitable for applications where component reliability estimation is critical. This device has been subjected to rigorous testing, including High Temperature Life tests at 150°C for 1,000 hours and Steady State Operating Life tests under specific conditions (250 mW, 150 V, 60 Hz, 25°C) for a minimum of 1,000 hours.
Environmental testing includes Solderability (260°C), Temperature Cycling (-65°C to +150°C), Thermal Shock (0°C to +100°C), Moisture Resistance (90-98% RH, -10 to +65°C), Shock (1500 G), Vibration (20 G min.), and Constant Acceleration (20,000 G). Terminal Strength and Hermeticity tests were also performed.
The datasheet indicates an Activation Energy (EA) of 1.3 eV and provides a graph for Mean Time To Failure (MTTF) versus Junction Temperature, suggesting typical MTTF values can reach 1.3 x 10^6 hours at lower junction temperatures. The ESD classification is Class I.
| Qty | Low | High |
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| 1+ | $1.00 | $1.00 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The HP 5082-3077 has undergone Solderability at 260°C, Temperature Cycling from -65°C to +150°C, Thermal Shock from 0°C to +100°C, Moisture Resistance for 10 days at 90-98% RH, Shock at 1500 G, Vibration at 20 G min., and Constant Acceleration at 20,000 G.
The Mean Time To Failure (MTTF) is dependent on junction temperature, with typical values reaching 1.3 x 10^6 hours.
The ESD classification for the HP 5082-3077 is Class I.
The activation energy (EA) is typically 1.3 eV.