| Distributor | Stock | Pricing | MOQ | PKG | Lead Time | Date Code | On Order Quantity | On Order Delivery | |
|---|---|---|---|---|---|---|---|---|---|
|
4 pcs
|
4 pcs | On Request | 1 | On Request | On Request | On Request | On Request | On Request |
| Category | |
| Manufacturer Name | |
| Mounting Type | |
| Noise Figure |
The 2N3955 is an N-Channel Dual Silicon Junction Field-Effect Transistor manufactured by TA-I Technology. This component is designed for applications requiring high input impedance and differential amplification.
Key electrical characteristics include a Gate Source Breakdown Voltage of -50V and a maximum Gate Current of 50mA. The device offers a typical Drain Saturation Current (Pulsed) ranging from 0.5mA to 5mA. Its Common Source Forward Transconductance (gfs) is rated up to 3000µS at 1 kHz and 1000µS at 200 MHz.
With a TO-71 package, the 2N3955 is suitable for through-hole mounting. The device's power dissipation is rated at 250mW per side, with a derating of 4.3mW/°C. It is designed for use in low and medium frequency differential amplifiers and high input impedance amplifiers.
Static electrical characteristics include a Gate Source Cutoff Voltage between -1V and -4.5V. Dynamic characteristics include input capacitance (Ciss) of 444pF and output capacitance (gos) of 35µS.
| Qty | Low | High |
|---|---|---|
| 1+ | $0.06 | $0.06 |
Estimated market price range - modelled values for guidance only, not live distributor offers.
The Gate Source Breakdown Voltage is -50V.
The maximum Gate Current is 50mA.
The typical Drain Saturation Current (Pulsed) is between 0.5mA and 5mA.
The typical Common Source Forward Transconductance at 1 kHz is 1000µS to 3000µS.
The package type is TO-71.